Article ISI
MATERIALS LETTERS  (2015)

Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers

Oyarzún, Diego P; Linarez Pérez, Omar; López Teijelo, Manuel; Zúñiga, Cesar; Jeraldo, Eduardo; Geraldo, Daniela A.; Arratia-Perez, Ramiro