Raman analysis of ferroelectric switching in niobium-doped lead zirconate titanate thin films
Abstract
Characteristic Raman vibration modes of niobium-doped lead zirconate titanate (PNZT) are studied as a function of ferroelectric domain switching. The microstructure of PNZT is characterized by scanning electron microscopy and X-ray diffraction. Ferroelectric switching is achieved by applying voltages between the top (Au) and bottom (Pt) electrodes, while acquiring the Raman spectra in situ. Vibrational active modes associated with paraelectric and ferroelectric phases are identified after measuring above and below the ferroelectric Curie temperature, respectively. Changes in the relative intensities of the Raman peaks are observed as a function of the switching voltage. The peak area associated with the ferroelectric modes is analyzed as a function of the applied voltage within one ferroelectric polarization loop, showing local maxima around the coercive voltage. This behavior can be understood in terms of the correlation between vibrational and structural properties, since ferroelectric switching modifies the interaction between the body-centered atom (Zr, Ti or Nb) and the Pb-O lattice. (C) 2014 Elsevier B.V. All rights reserved.
Más información
Título según WOS: | Raman analysis of ferroelectric switching in niobium-doped lead zirconate titanate thin films |
Título según SCOPUS: | Raman analysis of ferroelectric switching in niobium-doped lead zirconate titanate thin films |
Título de la Revista: | THIN SOLID FILMS |
Volumen: | 556 |
Editorial: | ELSEVIER SCIENCE SA |
Fecha de publicación: | 2014 |
Página de inicio: | 539 |
Página final: | 543 |
Idioma: | English |
DOI: |
10.1016/j.tsf.2014.02.050 |
Notas: | ISI, SCOPUS |