Characterization of food surfaces using scale-sensitive fractal analysis

Pedreschi, F.; aguilera, jm; Brown, CA

Abstract

Length-scale and area-scale analyses, two of the scale-sensitive fractal analyses performed by the software Surfrax www.surfract.com, were used to study food surfaces measured with a scanning laser microscope (SLM). The SLM measures surfaces, or textures (i.e., acquires topographical data as a collection of heights as a function of position), at a spatial and vertical resolution of 25 mu m. The measured textures are analyzed by using linear and areal tiling (length-scale and area-scale analysis) and by conventional statistical analyses. Area-scale and length-scale fractal complexities (Lsfc and Asfc) and the smooth-rough crossover (SRC) are derived from the scale-sensitive fractal analyses. Both measures proved adequate to quantify and differentiate surfaces of foods (e.g., chocolate and a slice of bread), which were smooth or porous to the naked eye. Surfaces generated after frying of potato products (e.g., potato chips and French fries) had similar values of Asfc and SRC, and larger (implying more complex and rougher surfaces) than those of the raw potato. Variability of surface texture characterization parameters as a function of the size of the measured region was used in selecting the size of the measured regions for further analysis. The length-scale method of profile analysis (also called the Richardson or compass method) was useful in determining the directionality or lay of the anisotropic texture on food surfaces.

Más información

Título según WOS: Characterization of food surfaces using scale-sensitive fractal analysis
Título según SCOPUS: Characterization of food surfaces using scale-sensitive fractal analysis
Título de la Revista: JOURNAL OF FOOD PROCESS ENGINEERING
Volumen: 23
Número: 2
Editorial: Wiley
Fecha de publicación: 2000
Página de inicio: 127
Página final: 143
Idioma: English
URL: http://doi.wiley.com/10.1111/j.1745-4530.2000.tb00507.x
DOI:

10.1111/j.1745-4530.2000.tb00507.x

Notas: ISI, SCOPUS