EVALUATION OF PROBABILISTIC SAMPLING METHODS IN THE CHARACTERIZATION OF ARCHAEOLOGICAL SITES THROUGH SUBSURFACE SOUNDING

Luis E. Cornejo B.

Keywords: evaluación subsuperficial, esquemas de muestreo, fracción de la muestra, Subsurface evaluation, sampling schemes, sample fraction

Abstract

This paper presents the results of an evaluation of the probabilistic sampling methods applied to subsurface sounding (e.g. test pit, auger holes) as tools to measure the density distribution of subsurface archaeological remains. By means of the simulation of three types of sites with different density distributions of subsurface archaeological materials and the application of different sampling schemes and sampling fractions, the degree of error in representing the density distribution of subsurface materials achieved with different sampling alternatives is observed. It is concluded, on the one hand, that a sampling scheme scarcely used in field archeology, sampling by interval transects, produces fewer errors. On the other hand, beyond the expected relation between the size of the sample and the precision with which a universe is represented, it has been possible to estimate which range of sampling fraction produces acceptable errors.

Más información

Título según WOS: EVALUATION OF PROBABILISTIC SAMPLING METHODS IN THE CHARACTERIZATION OF ARCHAEOLOGICAL SITES THROUGH SUBSURFACE SOUNDING
Título según SCOPUS: Evaluation of probabilistic sampling methods in the characterization of archaeological sites through subsurface sounding [Evaluación de los métodos de muestreo probabilísticos en la caracterización de sitios arqueológicos por medio de sondeos subsuperficiales]
Título según SCIELO: EVALUACI�N DE LOS M�TODOS DE MUESTREO PROBABIL�STICOS EN LA CARACTERIZACI�N DE SITIOS ARQUEOL�GICOS POR MEDIO DE SONDEOS SUBSUPERFICIALES
Título de la Revista: CHUNGARA-REVISTA DE ANTROPOLOGIA CHILENA
Volumen: 51
Número: 3
Editorial: UNIV TARAPACA
Fecha de publicación: 2019
Página de inicio: 427
Página final: 442
Idioma: Spanish
DOI:

10.4067/S0717-73562019005001303

Notas: ISI, SCIELO, SCOPUS