Abstract

The crystal structure of the new CuFeInTe3 quaternary compound was studied by the Rietveld method from powder X-ray diffraction data. The CuFeInTe3 compound crystallize in the tetragonal CuFeInTe3-type structure with space group P (4) over bar 2c (N degrees 112), and unit cell parameters a = 6.1842(1) angstrom, c = 12.4163(2) angstrom, V = 474.85(1) angstrom(3). The density of CuFeInTe3 is rho x = 5.753 g cm(-3). The reliability factors of the Rietveld refinement results are R-p = 5.5%, R-wp = 6.1%, R-exp = 4.7%, and S = 1.3. The powder XRD data of CuFeInTe3 are presented and the figures of merit of indexation are M-20 = 79.4 and F-30 = 43.3 (0.0045, 154).