Optical altimetry for microscale sediment layers

Noto, Daisuke; Fuentes, Tomas; Trewhela, Tomas; Ulloa, Hugo N.

Abstract

Measuring microscale sediment layers is critically important for geophysical, biomedical, and engineering systems. Here, we propose a novel optical method to quantify spatial distributions of microparticle layers at grain-size resolution. The method does not require specialized equipment, but utilizes a standard digital camera and scattered light from the sediment layers. With a simple implementation, it can account for inherent spatial trends originating from non-ideal lighting conditions, ensuring high flexibility and extensibility. Micrometric resolution is achieved in both spatial and depth dimensions, and demonstrated for underwater ripple patterns formed by fine organic particles. Our promising results offer direct practical application of the method to study granular layers, biofilms, and dust layer formation.

Más información

Título según WOS: ID WOS:001604928700001 Not found in local WOS DB
Título de la Revista: MEASUREMENT SCIENCE AND TECHNOLOGY
Volumen: 36
Número: 10
Editorial: IOP PUBLISHING LTD
Fecha de publicación: 2025
DOI:

10.1088/1361-6501/ae15b5

Notas: ISI