Abstract

Electric vehicle (EV) charging infrastructure is critical, especially considering the exponential increase in electric vehicle adoption over the last decade, leading to a surge in demand for charging stations. However, it is not just about increasing their number; consideration should also be given to the reliability and availability of these chargers. Several factors can affect power converter reliability, many of which have been studied independently of the application. Nevertheless, in addition to those EV chargers are subjected to unique controls and operation that depend on the different battery charging profiles that have been proposed. This work analyzes the impact of different load profiles on semiconductors, using a total of four different load profile strategies. The results show that there is a very similar impact on damage among the most mainstream charging profiles. However, the Pulse Charging (PC) profile stands out as one that accumulates more semiconductor damage, reducing EV charger reliability.