Article
PHYSICAL REVIEW B  (2017)

Three-dimensional characterization of Co/Pd multilayer thin films using resonant soft x-ray scattering

Flewett, Samuel; Mishra, Durgamadhab; Mori, Thiago J. A.; Günther, Christian M.; Denardin, Juliano C.; Oyarzún, Simón; Michea, Sebastián; Engel, Dieter; Fohler, Manuel; Rocha, Tulio C. R.; Ovalle F., Alexandra; Núñez A., Leandro T.; Pfau, Bastian; Escrig, Juan; Eisebitt, Stefan