Systematic error compensation in electronic speckle pattern shearing interferometry

Rodriguez-Vera, R; Rayas, J.A.; Martínez A; Mendoza-Santoyo, F.; Cordero, R. R.; Labbe, F.

Keywords: metal, strain, interferometry, measurement, pattern, error, sheet, analysis, properties, shearography, electronic, speckle, examination, digital, Tensile, Nondestructive, shearing, (ESPSI)

Abstract

Electronic speckle pattern shearing interferometry (ESPSI), also known as digital shearography, is a hole-field non-destructive, optical technique used to measure approximately the field of displacement derivatives. The accurate measurements of these derivatives have several problems one of them is that of ESPSI results are approximately equal to the derivatives, they are equal to the derivatives only if the shear distance tends to zero, hence, if experimental data rendered by ESPSI are taken directly as equal to the derivatives, the measurements may carry an important shearing error. Other error, ESPSI yields values relative to a reference value at a specific location of the field that can be very difficult to determine accurately. In this paper, we propose a general procedure to compensate the shearing error and to introduce the reference by adding two quantities to the values rendered by ESPSI. As an example, we measured a displacement derivative field induced on a metallic sheet specimen by applying tensile load.

Más información

Título de la Revista: Proceedings of SPIE - The International Society for Optical Engineering
Volumen: 6341
Editorial: SPIE
Fecha de publicación: 2006
URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-33749836906&partnerID=q2rCbXpz