Abstract

In a new stage of characterization of our plasma focus devices of hundred and tens of joules, (PF-400J and PF-50J), preliminary series of measurements on soft X-ray and ion beams have been performed in the device PF-400J (176-539 J, 880 nF, T/4 ∼300 ns). The device was operated in hydrogen to 7 mbar of pressure. The temporal and spatial X-ray characteristics are investigated by means filtered PIN diodes and a multipinhole camera. Graphite collectors, operating in the bias ion collector mode, are used to estimate the characteristic ion energy using the time flight across the probe array. The time of the ion beam emission to be correlated with plasma emission events associated with the soft X-ray pulses detected by the probes. Temporal correlations between soft X-ray signals and ion beams are performed. © 2006 American Institute of Physics.