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Comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques
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| Título según WOS: | Comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques |
| Título según SCOPUS: | Comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques |
| Título de la Revista: | Scripta Materialia |
| Volumen: | 67 |
| Número: | 07-ago |
| Editorial: | Acta Materialia Inc |
| Fecha de publicación: | 2012 |
| Página de inicio: | 736 |
| Página final: | 739 |
| Idioma: | English |
| URL: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84865458279&partnerID=40&md5=7c43c91c9fb692b04d6f3be09b467e23 |
| DOI: |
10.1016/j.scriptamat.2012.04.018 |
| Notas: | ISI, SCOPUS |