Abstract

C dS thinfilms implanted using He+ were studied using photothermal deflection spectroscopy (PTD) setup, using perpendicular pump-probe configuration. Samples were implanted with increasing ion energy so as to allow the ion to penetrate greater depths. An attempt for 2-dimensional imaging of implanted regions of different samples was carried out. Photothermal measurements were performed Samples were imaged for various modulation frequencies. Modulation frequency at 800 Hz revealed a maximum damaged layer, which corresponds approximately to the half the thickness.