Abstract

Typical image recognition systems operate in two stages: feature extraction to reduce the dimensionality of the input space, and classification based on the extracted features. Analog Very Large Scale Integration (VLSI) is an attractive technology to achieve compact and low-power implementations of these computationally intensive tasks for portable embedded devices. However, device mismatch limits the resolution of the circuits fabricated with this technology. Traditional layout techniques to reduce the mismatch aim to increase the resolution at the transistor level, without considering the intended application. Relating mismatch parameters to specific effects in the application level would allow designers to apply focalized mismatch compensation techniques according to predefined performance/cost tradeoffs. This paper models, analyzes, and evaluates the effects of mismatched analog arithmetic in both feature extraction and classification circuits. For the feature extraction, we propose analog adaptive linear combiners with on-chip learning for both Least Mean Square (LMS) and Generalized Hebbian Algorithm (GHA). Using mathematical abstractions of analog circuits, we identify mismatch parameters that are naturally compensated during the learning process, and propose cost-effective guidelines to reduce the effect of the rest. For the classification, we derive analog models for the circuits necessary to implement Nearest Neighbor (NN) approach and Radial Basis Function (RBF) networks, and use them to emulate analog classifiers with standard databases of face and hand-writing digits. Formal analysis and experiments show how we can exploit adaptive structures and properties of the input space to compensate the effects of device mismatch at the application level, thus reducing the design overhead of traditional layout techniques. Results are also directly extensible to multiple application domains using linear subspace methods. (C) 2014 Elsevier Ltd. All rights reserved.