Abstract

We report ferromagnetic resonance measurements of perpendicular magnetic anisotropy in thin films of Ta/Co20Fe60B20/MgO as a function of the Co20Fe60B20 layer thickness. The first and second order anisotropy terms show unexpectedly strong dependence on the external magnetic field applied to the system during the measurements. We propose strong interfacial spin pinning as a possible origin of the field-dependent anisotropy. Our results imply that high-field anisotropy measurements cannot be directly used for quantitative evaluation of zero-field performance parameters of CoFeB-based devices such as spin torque memory. (C) 2014 AIP Publishing LLC.