ConferencePaper SCOPUS
Latin America Optics and Photonics Conference, LAOP 2014  (2014)

Two-wavelength electronic speckle pattern interferometry for simultaneous measurement of two in-plane displacement fields

Martinez-Garcia, A; Cordero, R.; Rayas, J.A.

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Título según SCOPUS: Two-wavelength electronic speckle pattern interferometry for simultaneous measurement of two in-plane displacement fields
Título de la Revista: Latin America Optics and Photonics Conference, LAOP 2014
Editorial: Optical Society of America (OSA)
Fecha de publicación: 2014
Idioma: English
Notas: SCOPUS