ConferencePoster
 (2014)

XRD analysis of InGaN uniform layers grown on Si(111) without any buffer layers and on Sapphire

Gómez, V. J.; Gacevic, Ž.; Aseev, P.; Soto Rodriguez, P. E. D.; Kumar, P.; Calleja, E; Nötzel, R.; Sánchez-García, M. A.