Article ISI SCOPUS
NANOTECHNOLOGY  (2016)

Magnetic and electrical characterization of nickel-rich NiFe thin films synthesized by atomic layer deposition and subsequent thermal reduction

Espejo, A P; Zierold, R; Gooth, J; Dendooven, J; Detavernier, C; Escrig, J; Nielsch, K

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Título según WOS: Magnetic and electrical characterization of nickel-rich NiFe thin films synthesized by atomic layer deposition and subsequent thermal reduction
Título según SCOPUS: Magnetic and electrical characterization of nickel-rich NiFe thin films synthesized by atomic layer deposition and subsequent thermal reduction
Título de la Revista: NANOTECHNOLOGY
Volumen: 27
Número: 34
Editorial: IOP PUBLISHING LTD
Fecha de publicación: 2016
Idioma: English
DOI:

10.1088/0957-4484/27/34/345707
Notas: ISI, SCOPUS