K-S Relationship Identification Technique by EBSD
Abstract
This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.
Más información
Título de la Revista: | Key Engineering Materials |
Volumen: | 465 |
Fecha de publicación: | 2011 |
Página de inicio: | 415 |
Página final: | 418 |
DOI: |
10.4028/www.scientific.net/KEM.465.415 |