K-S Relationship Identification Technique by EBSD

Marinelli, M.C.; Moscato, M.G.; Signorelli, J.W.; El Bartali, A.; Alvarez-Armas, I.

Abstract

This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.

Más información

Título de la Revista: Key Engineering Materials
Volumen: 465
Fecha de publicación: 2011
Página de inicio: 415
Página final: 418
DOI:

10.4028/www.scientific.net/KEM.465.415