ConferencePaper ISI SCOPUS
Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)  (2010)

Sliding window trend analysis: A method for short and open circuit detection in copper electrorefining

Morales A.S.; Wiechmann E.P.; Aqueveque P.; Pino E.

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Título según WOS: Sliding Window Trend Analysis: A Method for Short and Open Circuit Detection in Copper Electrorefining
Título según SCOPUS: Sliding window trend analysis: A method for short and open circuit detection in copper electrorefining
Título de la Revista: Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)
Editorial: Institute of Electrical and Electronics Engineers Inc.
Fecha de publicación: 2010
Idioma: English
DOI:

10.1109/IAS.2010.5615654
Notas: ISI, SCOPUS