Review ISI SCOPUS
 (2018)

X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Valdivia, M. P.; Veloso F.; Stutman D.; Stoeckl C.; Mileham C.; Begishev I.A.; Theobald W.; Vescovi M.; Useche W.; Regan S.P.; Albertazzi B.; Rigon G.; Mabey P.; Michel T.; Pikuz S.A.; et. al.