ConferencePaper SCOPUS
Proceedings of the 2018 IEEE Sciences and Humanities International Research Conference, SHIRCON 2018  (2019)

Using big data for fault diagnosis in legacy manufacturing production lines

Muoz R.

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Título según SCOPUS: Using big data for fault diagnosis in legacy manufacturing production lines
Título de la Revista: Proceedings of the 2018 IEEE Sciences and Humanities International Research Conference, SHIRCON 2018
Editorial: Institute of Electrical and Electronics Engineers Inc.
Fecha de publicación: 2019
Idioma: Spanish
DOI:

10.1109/ICA-ACCA.2018.8609768
Notas: SCOPUS