An overview of x-ray spectrometry at research centers in Chile

Romo-Kroger, CM; Cornejo Ponce L.; Morales, JR; Dinator, MI; Avila, MJ; Poblete, VH; Galvez, J; Goldschmidt A.; Trier, A; Valdés J.; Rojas, CM; Cantillano, ME; Vera, R; Figueroa, R.; García, M

Abstract

Different procedures have been used to develop x-ray fluorescence spectroscopy in Chile. In this paper we describe those groups doing basic or applied scientific research, mainly associated with units at universities and research centers. The techniques are PIXE, common XRF, XRF excited with gamma sources, x-ray emission from an electron microprobe and the total reflection technique. Historical aspects and experimental features are mentioned. Theoretical and methodological projects are also described. Finally, the wide field of applications of XRF in Chile is presented. Copyright © 2002 John Wiley & Sons, Ltd.

Más información

Título según WOS: An overview of x-ray spectrometry at research centers in Chile
Título según SCOPUS: An overview of x-ray spectrometry at research centers in Chile
Título de la Revista: X-RAY SPECTROMETRY
Volumen: 31
Número: 2
Editorial: Wiley
Fecha de publicación: 2002
Página de inicio: 128
Página final: 131
Idioma: English
URL: http://doi.wiley.com/10.1002/xrs.558
DOI:

10.1002/xrs.558

Notas: ISI, SCOPUS