Abstract

Ellipsometric measurements of the optical thickness of C32 films adsorbed on SiO2-coated Si(100) substrates were carried out. A resolution and long-term stability comparable to that previously obtained with rare gases adsorbed on HOPG substrates in ultrahigh vacuum was demonstrated. The measurements revealed a rich structure in the temperature dependence of the polarization angle and stray light intensity previously unobserved with alkane films.