Off-resonance correction using an estimated linear time map

Akel, JA; Rosenblitt, M; Irarrázaval P.

Abstract

Images acquired in the presence of magnetic field deviations and reconstructed without taking into account the off-resonance, are distorted and corrupted with artifacts. Several post-processing algorithms have been developed for correcting the distortion when it is not possible to fix the field inhomogeneities. These off-resonance correction methods are, in general, slow and computing intensive. To make them faster they are usually adapted to a particular situation or approximated. One of these approximations is to assume that the field map is linear. Although this assumption makes the algorithm fast and robust it is not well suited for arbitrary field maps. On the other hand, there are k-space trajectories with an almost linear time map (time at which each k-space value is acquired), such as 2DFT and EPI. This paper presents an algorithm for off-resonance correction based on a linear time map approximation. This approximation allows a fast algorithm that takes advantage of the almost linearity of the time map and uses the whole field map to correct the images. The proposed correction algorithm reduces the off-resonance induced artifacts while being fast. The linear approximation of the time map needs to be done only once for each trajectory because it does not depend on the acquired image or field map data. The method can also be extended to a multi-plane approximation for sequences with more complex time maps. © 2002 Elsevier Science Inc. All rights reserved.

Más información

Título según WOS: Off-resonance correction using an estimated linear time map
Título según SCOPUS: Off-resonance correction using an estimated linear time map
Título de la Revista: MAGNETIC RESONANCE IMAGING
Volumen: 20
Número: 2
Editorial: Elsevier Science Inc.
Fecha de publicación: 2002
Página de inicio: 189
Página final: 198
Idioma: English
URL: http://linkinghub.elsevier.com/retrieve/pii/S0730725X02004873
DOI:

10.1016/S0730-725X(02)00487-3

Notas: ISI, SCOPUS