Background impurities in Si-0.8 Ge-0.2/Si/Si-0.8 Ge-0.2 n-type -doped QW

Tulupenko, V.; Duque, C. A.; Morales, A. L.; tiutiunnyk, a.; Demediuk, R.; Dmytrychenko, T.; Fomina, O.; Akimov, V.; Restrepo, R. L.; Mora-Ramos, M. E.

Abstract

Additional (residual) impurities in the barriers change the energy profile of a quantum well. This means that they alter the ionization energy for the impurity delta layer situated within the quantum well. In turn, this is accompanied by the change of a V-shaped quantum well created by ionization of the delta layer. All of this is the subject of studies presented in this article. It has been shown that the most dramatic are the changes in the difference between the space-quantized energy levels for an edge-doped quantum well.

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Título según WOS: ID WOS:000398824000021 Not found in local WOS DB
Título de la Revista: PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS
Volumen: 254
Número: 4
Editorial: WILEY-V C H VERLAG GMBH
Fecha de publicación: 2017
DOI:

10.1002/pssb.201600464

Notas: ISI