Memristive Logic in Crossbar Memory Arrays: Variability-Aware Design for Higher Reliability

Escudero M.; Vourkas I.; Rubio A.; Moll F.

Abstract

The advent of the first TiO2-based memristor in 2008 revived the scientific interest both from academia and industry for this device technology and has so far led to several emerging applications including logic and in-memory computing. Several memristive logic families have been proposed in the current quest for energy-efficient future computing systems. However, the limited device endurance and variability (both cycle-to-cycle and device-to-device) are important parameters to be considered in the assessment of logic operations. In this work, we used an accurate physics-based model of a bipolar memristor (supporting parasitics of the device structure and variability of switching voltages and resistance states) and demonstrate that performance of memristor-based in-memory computations can de degraded owing to both variability and state drift impact, if such features are not properly considered in the design flow. Inspired on pseudo-NMOS ratioed logic and based upon a previous CMOS-like logic scheme, we propose a crossbar-compatible memristive ratioed logic style which is tolerant to device variability and does not affect device endurance as computations do not involve conditional switching of memristors. Using the Cadence Virtuoso suite, we compare this logic scheme with MAGIC and CNIMP approaches, focusing on the universal NOR gate and more complex logic functions.

Más información

Título según WOS: Memristive Logic in Crossbar Memory Arrays: Variability-Aware Design for Higher Reliability
Título según SCOPUS: Memristive logic in crossbar memory arrays: Variability-aware design for higher reliability
Título de la Revista: IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volumen: 18
Editorial: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Fecha de publicación: 2019
Página de inicio: 635
Página final: 646
Idioma: English
DOI:

10.1109/TNANO.2019.2923731

Notas: ISI, SCOPUS