Time evolution of hollow cathode ionization processes in the final breakdown phase of a transient hollow cathode discharge

Zambra, M; Favre, M; Moreno, J; Chuaqui, H; Wyndham, E; Choi, P

Abstract

The enhanced ionization processes taking place inside the hollow cathode region (HCR) of a transient hollow cathode discharge (THCD) are essential events which lead to final electrical breakdown. This ionization growth is permanently assisted by a virtual anode moving in the anode-cathode gap (A-K gap), which extends the anode potential to within the hollow cathode region. In this paper, the ionization growth inside the HCR under enhanced field due to the close proximity of the anode potential has been studied using a statistical technique in a range of pressures, with three different cathode apertures. Statistical time distributions of an extensive experimental data set are analyzed to understand the mechanisms involved in the final stages, just before electric breakdown.

Más información

Título según WOS: ID WOS:000081448700012 Not found in local WOS DB
Título de la Revista: IEEE TRANSACTIONS ON PLASMA SCIENCE
Volumen: 27
Número: 3
Editorial: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Fecha de publicación: 1999
Página de inicio: 746
Página final: 751
DOI:

10.1109/27.774678

Notas: ISI