Multi-planar Full-Field Blur Correction Algorithm for Infrared Microscopy
Keywords: image processing, infrared microscopy, infrared imaging, thermal imaging, blurring artifact, 3D microscopy
Abstract
The present work proposes a method for the 3-D full-field focusing for microscopic infrared (IR) imagery. It is based on the partial analysis of Point Spread Function (PSF) for a confined volumetric universe of vision in a microscopic IR system. The ability of the algorithm to compensate for localized blur is demonstrated using two different real MWIR microscopic video sequences, which were captured from two microscopic living organisms using a Janos-Sofradir MWIR microscopy setup. The performance of the proposed algorithm is assessed on real and simulated infrared data by computing the root mean-square error and the roughness-laplacian pattern, which was specifically developed for the present work.
Más información
Título de la Revista: | PROCEEDINGS |
Volumen: | 27 |
Número: | 1 |
Editorial: | MDPI AG |
Fecha de publicación: | 2019 |
Página de inicio: | 52 |
Página final: | 57 |
Idioma: | English |
Financiamiento/Sponsor: | MDPI |
URL: | https://www.mdpi.com/2504-3900/27/1/52 |
DOI: |
10.3390/proceedings2019027052 |