Multi-planar Full-Field Blur Correction Algorithm for Infrared Microscopy

JARA; Torres; Machuca; gutierrez; Viafora

Keywords: image processing, infrared microscopy, infrared imaging, thermal imaging, blurring artifact, 3D microscopy

Abstract

The present work proposes a method for the 3-D full-field focusing for microscopic infrared (IR) imagery. It is based on the partial analysis of Point Spread Function (PSF) for a confined volumetric universe of vision in a microscopic IR system. The ability of the algorithm to compensate for localized blur is demonstrated using two different real MWIR microscopic video sequences, which were captured from two microscopic living organisms using a Janos-Sofradir MWIR microscopy setup. The performance of the proposed algorithm is assessed on real and simulated infrared data by computing the root mean-square error and the roughness-laplacian pattern, which was specifically developed for the present work.

Más información

Título de la Revista: PROCEEDINGS
Volumen: 27
Número: 1
Editorial: MDPI AG
Fecha de publicación: 2019
Página de inicio: 52
Página final: 57
Idioma: English
Financiamiento/Sponsor: MDPI
URL: https://www.mdpi.com/2504-3900/27/1/52
DOI:

10.3390/proceedings2019027052