Multiplanar full-field blur correction method for infrared microscopy imaging
Abstract
We propose a 3D full-field focusing method for microscopic mid-wave infrared (MWIR) imagery. The method is based on the experimental estimation of a confined volumetric vision microscope point spread function. The technique employs our well-known constant-range-based nonuniformity correction algorithm as a preprocessing step and then an iteration in the ????-axis Fourier-based deconvolution. The technique’s ability to compensate for localized blur is demonstrated using two different real MWIR microscopic video sequences, captured from two microscopic living organisms using a Janos-Sofradir MWIR microscopy setup. The performance of the proposed algorithm is assessed on real and simulated noisy infrared data by computing the root-mean-square error and the roughness Laplacian pattern indexes, which are specifically developed for the present work.
Más información
Título de la Revista: | Applied Optics |
Volumen: | 59 |
Número: | 17 |
Editorial: | OSApublishing |
Fecha de publicación: | 2020 |
Página de inicio: | 5142 |
Página final: | 5150 |
Idioma: | English |
Financiamiento/Sponsor: | Optical Society of America |
URL: | https://www.osapublishing.org/ao/abstract.cfm?uri=ao-59-17-5142 |
DOI: |
10.1364/AO.387120 |
Notas: | ISI |