Multiplanar full-field blur correction method for infrared microscopy imaging

Jara, Anselmo; Torres, Sergio; Machuca, Guillermo

Abstract

We propose a 3D full-field focusing method for microscopic mid-wave infrared (MWIR) imagery. The method is based on the experimental estimation of a confined volumetric vision microscope point spread function. The technique employs our well-known constant-range-based nonuniformity correction algorithm as a preprocessing step and then an iteration in the ????-axis Fourier-based deconvolution. The technique’s ability to compensate for localized blur is demonstrated using two different real MWIR microscopic video sequences, captured from two microscopic living organisms using a Janos-Sofradir MWIR microscopy setup. The performance of the proposed algorithm is assessed on real and simulated noisy infrared data by computing the root-mean-square error and the roughness Laplacian pattern indexes, which are specifically developed for the present work.

Más información

Título de la Revista: Applied Optics
Volumen: 59
Número: 17
Editorial: OSApublishing
Fecha de publicación: 2020
Página de inicio: 5142
Página final: 5150
Idioma: English
Financiamiento/Sponsor: Optical Society of America
URL: https://www.osapublishing.org/ao/abstract.cfm?uri=ao-59-17-5142
DOI:

10.1364/AO.387120

Notas: ISI