Abstract

Deposition processes of bismuth oxides have been investigated using the Bi(C6H5)(3) precursor. The role of the MOCVD parameters has been evaluated through the study of both the precursor sublimation and the entire CVD process depending on the temperature and the reactor environment. In the 350-450 degreesC range, Bi2O3 deposition follows a heterogeneous pathway leading to the dissociation of Bi-phenyl bonds. O-2 plays a determining role in both the precursor decomposition and Bi2O3 growth. Above 450 degreesC, the oxidative break-down of the aromatic ring has been also observed. The temperature effect on Bi2O3 growth on platinum and iridium substrates has been investigated by grazing incident X-ray diffraction, SEM, and EDX measurements. Overall results indicate that a heterogeneous process predominantly controls the Bi2O3 deposition.