Open and Short Circuit Post-Fault Control Strategies for Multi-Three-Phase Interior Permanent Magnet Machines

Azlia Abdulrahman; Alessandro Galassini; Michele Degano; Giampaolo, Buticchi; Cristian E Pesce; Chris Gerada; Bozhko, Serhiy; Haider Abbas F. Almurib

Keywords: Multi-three-phase machine, current control , fault tolerance , reliability , aerospace applications

Abstract

This paper presents a post-fault current control strategy for dual three-phase Interior Permanent Magnet (IPM) synchronous machines. The current controllers are designed based on the Vector Space Decomposition (VSD) algorithm. This take into account the equivalent harmonic inductance variation, which is then used to introduce the post-fault compensation control. A double three-phase IPM machine is modelled and operated in three different operating conditions: nominal, one three-phase set in short-circuit (SC), and one three-phase set in open-circuit (OC). By keeping the current loop bandwidth constant, the proposed fault-tolerant current controllers guarantee the same dynamic performance of the remaining healthy module after the faults occurred. In OC fault, the proportional and integral (PI) controllers are redesigned while adapting the inductance variation. For the SC case, constant stability margins are provided by cascading a novel lag compensator to the nominal controller. The current dynamics responses are analysed in both healthy and faulty conditions by means of Matlab/Simulink simulations. Experimental results on a 30kW six-phase IPM machine prototype with isolated neutral points and supplied by two custom three-phase converters, are demonstrating the effectiveness of the proposed control strategies

Más información

Título de la Revista: IEEE TRANSACTIONS ON ENERGY CONVERSION
Editorial: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Fecha de publicación: 2021
Idioma: ingles
Financiamiento/Sponsor: IEEE
URL: https://ieeexplore.ieee.org/document/9462532/keywords#keywords
DOI:

10.1109/TEC.2021.3090982

Notas: WOS Core Collection ISI