Abstract

The advances achieved in infrared (IR) focal plane array (FPA) sensors, and IR optical magnification technology integrated into these systems (IR Microscopy) have enabling reliable detection of micrometer-scale thermal scenes [1]. However, IR images with severe degradation are still been achieved, resulting from the imperfect nature of these system’s optoelectronic characteristics, mainly yielded by the Blurring artifacts [2, 3]. Hence, to experimentally solve the sample’s multiplanar optical dispersion, in this work, we propose estimating the IR microscope Point Spread Function (PSF) from the full depths of fields from the optical system, as the key information to yield Image Restoration on it.