Article ISI SCOPUS
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS  (2007)

An indirect method to measure the electric charge deposited on insulators during PIXE analysis

Dinator, MI; Cancino, SA; Miranda, PA; Morales, JR; Seelenfreund, A

Abstract

Total charge deposited by a proton beam in an insulator during PIXE analysis has been indirectly determined using a Mylar film coated with cobalt. Elemental concentrations in the samples, pieces of volcanic glass, were obtained and compared to concentrations determined by ICP OES on the same samples. The strong agreement between these results shows the accuracy of the charge determined by this method. © 2007 Elsevier B.V. All rights reserved.

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Título según WOS: An indirect method to measure the electric charge deposited on insulators during PIXE analysis
Título según SCOPUS: An indirect method to measure the electric charge deposited on insulators during PIXE analysis
Título de la Revista: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volumen: 263
Número: 2
Editorial: ELSEVIER SCIENCE BV
Fecha de publicación: 2007
Página de inicio: 529
Página final: 531
Idioma: English
URL: http://linkinghub.elsevier.com/retrieve/pii/S0168583X07013353
DOI:

10.1016/j.nimb.2007.07.011
Notas: ISI, SCOPUS