Abstract

In this work, Ti-13Ta-xSn samples were manufactured using the powder metallurgy technique with a porosity near 35 %. The microstructural analysis revealed that increased Sn content decreased the alpha-Ti and alpha'-Ti phases. Furthermore, scanning electron microscopy and X-ray photoelectron spectroscopy showed that the chemical composition of the passive oxide film was influenced by the Sn content. Moreover, the electrochemical analysis revealed that the protective properties of oxide film improved with the Sn addition.