Characterisation of aerosol from Santiago, Chile: an integrated PIXE-SEM-EDX study

Morata, D; Polve, M; Valdes, A; Belmar M.; Dinator, MI; Silva M.; LEIVA, MA; Aigouy, T; Morales, JR

Abstract

Santiago de Chile is a big city with huge air quality problems, being one of the most polluted cities in the world. This is aggravated during winter by the topography and meteorological conditions of the city. Although public policies have been developed to minimise the atmospheric aerosol pollution, there is a lack of adequate knowledge and poor characterisation of these aerosols (in its PM 2.5 and PM 10 fractions). In this study we sampled atmospheric particles during winter in two distinct areas of Santiago: downtown (Teatinos Street) and in a more residential area (Macul). Major (Si, Al, Fe, Ca and K) and some trace element (S, Cl, Ti, P, Cr, Cu and Zn) compositions were obtained by proton-induced X-ray emission (PIXE). Morphological, type and chemical characterisation was also performed using scanning electron microscopy (SEM) coupled with an energy dispersive X-ray microanalysis system (SEM-EDX). Besides the carbon particles, the contribution of which can be quite important in the atmospheric aerosol, especially in downtown, unambiguously lithogenic (i.e. of geological origin) particles and elements are the second highest contributors. Enrichment factor calculation, together with particle identification and element correlation allow the origin of some elements and particles to be traced, revealing anthropogenic origins for some of them that are specific to the Santiago area. © 2007 Springer-Verlag.

Más información

Título según WOS: Characterisation of aerosol from Santiago, Chile: an integrated PIXE-SEM-EDX study
Título según SCOPUS: Characterisation of aerosol from Santiago, Chile: An integrated PIXE-SEM-EDX study
Título de la Revista: Environmental Geology
Volumen: 56
Número: 1
Editorial: no publisher
Fecha de publicación: 2008
Página de inicio: 81
Página final: 95
Idioma: English
URL: http://link.springer.com/10.1007/s00254-007-1141-8
DOI:

10.1007/s00254-007-1141-8

Notas: ISI, SCOPUS