Probability Density Function of Reliability Metrics in BICM with Arbitrary Modulation: Closed-form through Algorithmic Approach
Abstract
In the popular bit-interleaved coded modulation (BICM) the output of the channel encoder and the input of the modulator are separated by a bit-level interleaver. From the decoder's point of view, the modulator, the transmission channel, and the demodulator (calculating bits' reliability metrics) become a memoryless BICM channel with binary inputs and real outputs. In unfaded channels, the BICM channel's outputs (reliability metrics) are known to be Gaussian for binary- or quaternary phase shift keying but their probability density function (PDF) is not known for higher-order modulation. We fill this gap by presenting an algorithmic method to calculate closed-form expressions for the PDF of reliability metrics in BICM with arbitrary modulation and bits-to-symbol mapping when the so-called max-log approximation is applied. Such probabilistic description of BICM channel is useful to analyze, from an informationtheoretic point of view, any BICM constellation/mapping design. © 2008 IEEE.
Más información
| Título según WOS: | Probability density function of reliability metrics in BICM with arbitrary modulation: Closed-form through algorithmic approach |
| Título según SCOPUS: | Probability density function of reliability metrics in BICM with arbitrary modulation: Closed-form through algorithmic approach |
| Título de la Revista: | IEEE TRANSACTIONS ON COMMUNICATIONS |
| Volumen: | 56 |
| Número: | 5 |
| Editorial: | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| Fecha de publicación: | 2008 |
| Página de inicio: | 736 |
| Página final: | 742 |
| Idioma: | English |
| URL: | http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=4524856 |
| DOI: |
10.1109/TCOMM.2008.060169 |
| Notas: | ISI, SCOPUS |