Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic
Abstract
Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10-150 J, 8-30 ps laser pulses, while two pulsed-power generators (â¼350 kA, 350 ns and â¼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm-3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.
Más información
| Título según WOS: | Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic |
| Título según SCOPUS: | Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic |
| Título de la Revista: | Review of Scientific Instruments |
| Volumen: | 92 |
| Número: | 6 |
| Editorial: | American Institute of Physics Inc. |
| Fecha de publicación: | 2021 |
| Idioma: | English |
| DOI: |
10.1063/5.0043655 |
| Notas: | ISI, SCOPUS |