Abstract

Advances in emerging resistive random-access memory (ReRAM) technology show promise for its use in future computing systems, enabling neuromorphic and memory-centric computing architectures. However, one aspect that holds back the widespread practical use of ReRAM is the behavioral variability of resistive switching devices. In this context, a radically new path towards ReRAM-based electronics concerns the exploitation of noise and the Stochastic Resonance (SR) phenomenon as a mechanism to mitigate the impact of variability. While SR has been already demonstrated in ReRAM devices and its potential impact has been analyzed for memory applications, related works have only focused on voltage input signals. In this work we present preliminary results concerning the exploration of SR in current-driven ReRAM devices, commercially available by Knowm Inc. Our results indicate that additive noise of amplitude sigma = 0.125uA can stabilize the cycling performance of the devices, whereas higher noise amplitude improves the HRS-LRS resistance window, thus could affect positively the Bit Error Rate (BER) metric in ReRAM memory applications.