Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code

Valdivia, Maria Pia; Perez-Callejo, Gabriel; Izquierdo, Luisa; Veloso, Felipe; Truong, Ann; Hu, Hanyu; Dilworth, Noah; Bott-Suzuki, Simon C.; Bouffetier, Victorien

Abstract

We present the analysis of interferometry diagnostics with the user-friendly Talbot Numerical Tool (TNT), a Fourier-based postprocessing code that enables real-time assessment of plasma systems. TNT performance was explored with visible and infrared interferometry in pulsed-power-driven Z-pinch configurations to expand its capabilities beyond Talbot X-ray interferometry in the high-intensity laser environment. TNT enabled accurate electron density characterization of magnetically driven plasma flows and shocks through phase-retrieval methods that did not require data modification or masking. TNT demonstrated enhanced resolution, detecting below 4% fringe shift, which corresponds to 8.7 x 10(15) cm(-2) within 28 mu m, approaching the laser probing system limit. TNT was tested against a well-known interferometry analysis software, delivering an average resolving power nearly ten times better (similar to 28 mu m versus similar to 210 mu m) when resolving plasma ablation features. TNT demonstrated higher sensitivity when probing sharp electron density gradients in supersonic shocks. A maximum electron areal density of 4.1 x 10(17)cm(-2) was measured in the shocked plasma region, and a minimum electron density detection of similar to 1.0 x 10(15)cm(-2) was achieved. When probing colliding plasma flows, the calculations of the effective adiabatic index and the associated errors were improved from gamma*=2.6 +/- 1.6-1.4 +/- 0.2 with TNT postprocessing, contributing valuable data for the interpretation of radiative transport. Additional applications of TNT in the characterization of pulsed-power plasmas and beyond are discussed.

Más información

Título según WOS: Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code
Título de la Revista: IEEE TRANSACTIONS ON PLASMA SCIENCE
Editorial: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Fecha de publicación: 2024
DOI:

10.1109/TPS.2024.3420910

Notas: ISI