Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code

Valdivia, Maria Pia; Perez-Callejo, Gabriel; Izquierdo, Luisa; Veloso, Felipe; Truong, Ann; Hu, Hanyu; Dilworth, Noah; Bott-Suzuki, Simon C.; Bouffetier, Victorien

Abstract

We present the analysis of interferometry diagnostics with the user-friendly Talbot Numerical Tool (TNT), a Fourier-based postprocessing code that enables real-time assessment of plasma systems. TNT performance was explored with visible and infrared interferometry in pulsed-power-driven Z-pinch configurations to expand its capabilities beyond Talbot X-ray interferometry in the high-intensity laser environment. TNT enabled accurate electron density characterization of magnetically driven plasma flows and shocks through phase-retrieval methods that did not require data modification or masking. TNT demonstrated enhanced resolution, detecting below 4% fringe shift, which corresponds to 8.7× 1015 cm-2 within 28? m, approaching the laser probing system limit. TNT was tested against a well-known interferometry analysis software, delivering an average resolving power nearly ten times better (? 28? m versus ? 210? m) when resolving plasma ablation features. TNT demonstrated higher sensitivity when probing sharp electron density gradients in supersonic shocks. A maximum electron areal density of 4.1× 1017 cm-2 was measured in the shocked plasma region, and a minimum electron density detection of ? 1.0× 1015 cm-2 was achieved. When probing colliding plasma flows, the calculations of the effective adiabatic index and the associated errors were improved from ??=2.6 ± ~1.6 -1.4± ~ 0.2 with TNT postprocessing, contributing valuable data for the interpretation of radiative transport. Additional applications of TNT in the characterization of pulsed-power plasmas and beyond are discussed. © 1973-2012 IEEE.

Más información

Título según WOS: Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code
Título según SCOPUS: Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code
Título de la Revista: IEEE Transactions on Plasma Science
Volumen: 52
Número: 10
Editorial: Institute of Electrical and Electronics Engineers Inc.
Fecha de publicación: 2024
Página de inicio: 4895
Página final: 4905
Idioma: English
DOI:

10.1109/TPS.2024.3420910

Notas: ISI, SCOPUS