Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code
Abstract
We present the analysis of interferometry diagnostics with the user-friendly Talbot Numerical Tool (TNT), a Fourier-based postprocessing code that enables real-time assessment of plasma systems. TNT performance was explored with visible and infrared interferometry in pulsed-power-driven Z-pinch configurations to expand its capabilities beyond Talbot X-ray interferometry in the high-intensity laser environment. TNT enabled accurate electron density characterization of magnetically driven plasma flows and shocks through phase-retrieval methods that did not require data modification or masking. TNT demonstrated enhanced resolution, detecting below 4% fringe shift, which corresponds to 8.7× 1015 cm-2 within 28? m, approaching the laser probing system limit. TNT was tested against a well-known interferometry analysis software, delivering an average resolving power nearly ten times better (? 28? m versus ? 210? m) when resolving plasma ablation features. TNT demonstrated higher sensitivity when probing sharp electron density gradients in supersonic shocks. A maximum electron areal density of 4.1× 1017 cm-2 was measured in the shocked plasma region, and a minimum electron density detection of ? 1.0× 1015 cm-2 was achieved. When probing colliding plasma flows, the calculations of the effective adiabatic index and the associated errors were improved from ??=2.6 ± ~1.6 -1.4± ~ 0.2 with TNT postprocessing, contributing valuable data for the interpretation of radiative transport. Additional applications of TNT in the characterization of pulsed-power plasmas and beyond are discussed. © 1973-2012 IEEE.
Más información
| Título según WOS: | Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code |
| Título según SCOPUS: | Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code |
| Título de la Revista: | IEEE Transactions on Plasma Science |
| Volumen: | 52 |
| Número: | 10 |
| Editorial: | Institute of Electrical and Electronics Engineers Inc. |
| Fecha de publicación: | 2024 |
| Página de inicio: | 4895 |
| Página final: | 4905 |
| Idioma: | English |
| DOI: |
10.1109/TPS.2024.3420910 |
| Notas: | ISI, SCOPUS |