Multiple-reflections single-shot dispersion scan for fast ultrashort-pulse measurements

Capdeville, Francisco; Villanueva, Fernando; Hidalgo-Rojas, Diego; Wahaia, Faustino; Wheatley, Robert Alastair; Wallentowitz, Sascha; Volkmann, Ulrich; Seifert, Birger

Abstract

A single-shot non-interferometric ultrashort-pulse measurement method based on the dispersion scan (d-scan) technique with a substantially extended time span for the pulses to be measured is presented. While single-shot d-scan is typically used for rather short femtosecond pulses, the presented multiple-reflections d-scan (MR d-scan) technique allows measurement of both short and long femtosecond pulses. Single-shot d-scan is currently limited to pulses with a maximum duration of 60 fs using a chromatic dispersion, i.e., a group delay dispersion (GDD) of 4400 fs2 2 at 840 nm provided by customized random nonlinear crystals. MR d-scan achieves a GDD of 31100 fs2 2 at 820 nm in this work, but can generally achieve an increase in GDD of up to two orders of magnitude. MR d-scan works with commonly available output couplers, does not rely on a homogeneous, precisely imaged beam profile and has an in-line configuration. As an example, long femtosecond double pulses are measured and reconstructed. (c) 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement

Más información

Título según WOS: Multiple-reflections single-shot dispersion scan for fast ultrashort-pulse measurements
Título de la Revista: OPTICS EXPRESS
Volumen: 32
Número: 16
Editorial: Optica Publishing Group
Fecha de publicación: 2024
Página de inicio: 28742
Página final: 28752
DOI:

10.1364/OE.529440

Notas: ISI