X-ray diffraction line profile analysis of Cu -2 wt. % Cr-6 wt. % Mo alloy mechanically alloyed Análisis de perfiles de difracción de una aleación Cu -2 % en peso Cr -6 % en peso Mo, aleada mecánicamente

Aguilar C.; Martínez V; Ordonez, S; Pavez O.; Valderrama, L

Keywords: copper, systems, distance, microstructure, size, structures, x-ray, crystallites, fault, risk, structure, profile, ray, strains, line, xrd, alloys, energies, time, molybdenum, diffraction, tool, chromium, densities, probability, analysis, assessment, fcc, mechanical, properties, nanocrystalline, stacking, dislocation, milling, cu-cr-mo, alloying, nanostructured, Materials, X, and, average, Ternary, Crystallite, (machining), Alloyed, anisotropic, characterizations, Mechanically, Pow, erful, Micro-strain, Nano-materials, Stacking-fault


By X-ray diffraction line profile analysis it is possible to obtain valid information of structure and properties of materials. This method is a powerful tool for nanomaterials microstructure characterization. In the present work mechanical alloying of ternary system Cu -2 wt. % Cr -6 wt. % Mo was made between 0.25 and 4 h of milling. By means of modified Warren-Averbach and Williamson-Hall methods the crystallite size, dislocation density, microstrain and average distance between dislocations were estimated. The crystallite size values were corrected by stacking fault presence. It was demonstrated that powders have a high anisotropic strain, which was corrected using the average dislocation contrast factors for fcc structures. Also the influence of milling time and percentage of solute on stacking fault probability and stacking fault energy was determined.

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Título de la Revista: REVISTA DE METALURGIA
Volumen: 44
Número: 3
Fecha de publicación: 2008
Página de inicio: 243
Página final: 250
URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-50249178650&partnerID=q2rCbXpz