Electronic speckle pattern interferometer design to get maximum sensitivity on the measurement of displacement vector fields

Martínez A; Rayas, JA; Cordero, R.

Abstract

In the present work, different geometries of interferometers with three divergent illumination beams are discussed. It is shown that the sensitivity components for each source can be measured with a maximum weight factor. The three sources were placed respectively, on x, y and near to z axis of a coordinate system. Based on our theoretical calculations it is proposed an interferometer that uses ESPI technique. Experimental results of displacements and strains are presented for one elastic surface when a torsion load is applied near to the target centre. © 2005 Elsevier B.V. All rights reserved.

Más información

Título según WOS: Electronic speckle pattern interferometer design to get maximum sensitivity on the measurement of displacement vector fields
Título según SCOPUS: Electronic speckle pattern interferometer design to get maximum sensitivity on the measurement of displacement vector fields
Título de la Revista: OPTICS COMMUNICATIONS
Volumen: 262
Número: 1
Editorial: ELSEVIER SCIENCE BV
Fecha de publicación: 2006
Página de inicio: 8
Página final: 16
Idioma: English
URL: http://linkinghub.elsevier.com/retrieve/pii/S0030401805013684
DOI:

10.1016/j.optcom.2005.12.034

Notas: ISI, SCOPUS