Investigation of dielectric and piezoelectric properties of niobium-modified PLSZFT nanoceramics for sensor and actuator applications

Ramam, K; Bell, AJ; Bowen, CR; Chandramouli K.

Abstract

In this paper, the microstructure, dielectric and piezoelectric properties of pentavalent Nb 5+ on isovalent Sr 2+ and acceptor Fe 3+-modified PLZT have been reported. Nanocrystalline ceramic compositions [Pb 0.973La 0.012Sr 0.015][(Zr 0.54Ti 0.46) 0.9895-(5n/4)Fe 0.01Nb n]O 3 (PLSZFNT) where n = 0, 0.2, 0.4, 0.6, 0.8 and 1 mol%) near morphotrophic phase boundary were fabricated through solid-state reaction method. X-ray diffraction patterns indicated that pure PLZT showed the presence of rhombohedral phase, and Fe and Sr incorporation into PLZT (PLSZFT) lattice shifted to coexistence of both rhombohedral and tetragonal phases while increasing Nb content in PLSZFT resulted in enhanced tetragonality. The tolerance factor (t = 1.00) indicates an ideal and stable tetragonal structure of PLSZFNT lattice. Grain size and apparent density were maximum at Nb 0.01. TEM studies indicated that average particle size ranged from 16 to 63 nm. The effect of grain growth on dielectric and piezoelectric properties were studied. The optimum dielectric and piezoelectric properties were found (e RT = 2862, d 33 = 491 pC/N and k p = 0.522) in n = 1 mol%, respectively, which could be suitable for possible sensor and actuator applications. © 2008 Elsevier B.V. All rights reserved.

Más información

Título según WOS: Investigation of dielectric and piezoelectric properties of niobium-modified PLSZFT nanoceramics for sensor and actuator applications
Título según SCOPUS: Investigation of dielectric and piezoelectric properties of niobium-modified PLSZFT nanoceramics for sensor and actuator applications
Título de la Revista: JOURNAL OF ALLOYS AND COMPOUNDS
Volumen: 473
Número: 01-feb
Editorial: Elsevier BV
Fecha de publicación: 2009
Página de inicio: 330
Página final: 335
Idioma: English
URL: http://linkinghub.elsevier.com/retrieve/pii/S0925838808008748
DOI:

10.1016/j.jallcom.2008.05.092

Notas: ISI, SCOPUS