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Claudia Arellano Vidal

Directora Nacional de I+D Área I&T

universidad Tecnologica de Chile

Santiago, Chile

Líneas de Investigación


Computer Vision, Pattern Recognition, Robust Statistics, Artificial Intelligence

Educación

  •  PhD in Computer Sciences and Statistics, University of Dublin, Trinity College. Irlanda, 2014
  •  Magíster en Ciencias de la Ingeniería (ingeniería Eléctrica), PONTIFICIA UNIVERSIDAD CATOLICA DE CHILE. Chile, 2005
  •  Ingeniera Civil Industrial Electrica, PONTIFICIA UNIVERSIDAD CATOLICA DE CHILE. Chile, 2003
  •  Licenciatura en Ciencias de la Ingenieria, PONTIFICIA UNIVERSIDAD CATOLICA DE CHILE. Chile, 2002

Experiencia Académica

  •   Directora de Investigación y Desarrollo Full Time

    Universidad Tecnologica de Chile, Inacap

    Informática y Telecomunicaciones

    santiago, Chile

    2018 - A la fecha

  •   Investigadora Full Time

    PONTIFICIA UNIVERSIDAD CATOLICA DE CHILE

    Ingenieria electrica

    santiago, Chile

    2004 - 2005

Experiencia Profesional

  •   Product Manager Full Time

    Dimacofi SA

    santiago, Chile

    2005 - 2006

  •   Jefe de área de I+D Full Time

    Dimacofi S.A

    Chile

    2006 - 2007

  •   Project Manager Full Time

    Procter & Gamble

    Santiago, Chile

    2008 - 2009

  •   Project Manager Full Time

    Dimacofi Negocios Avanzados (DNA)

    Santiago, Chile

    2014 - 2015

  •   SubGerente de Desarrollo de Negocios Full Time

    Dimacofi SA

    santiago , Chile

    2015 - 2018


 

Article (13)

Deepblueberry: Quantification of Blueberries in the Wild Using Instance Segmentation

Gonzalez, Sebastian; Arellano, Claudia; Tapia, Juan E.

Article ISI SCOPUS
IEEE ACCESS  (2019)

Soft-biometrics encoding conditional GAN for synthesis of NIR periocular images

Tapia J.E.; ARELLANO, C

Article ISI SCOPUS
FUTURE GENERATION COMPUTER SYSTEMS-THE INTERNATIONAL JOURNAL OF ESCIENCE  (2019)

Robust ellipse detection with Gaussian mixture models

Arellano, Claudia; Dahyot, Rozenn

Article
PATTERN RECOGNITION  (2016)

Robust shape from depth images with GR2T

Ruttle J.; ARELLANO, C; Dahyot R.

Article SCOPUS
Pattern Recognition Letters  (2014)

Robust Shape from Depth Images with GR2T

J. Ruttle, C. Arellano and R. Dahyot

Article
Pattern Recognition Letters  (2014)

Robust Bayesian Fitting of 3D Morphable Model



Article
Proceedings of the 10th European Conference on Visual Media Production  (2013)

Extrinsic Camera Parameters Estimation for Shape-from-Depths,

J. Ruttle, C. Arellano and R. Dahyot

Article
20th European Signal Processing Conference (Eusipco), Bucharest Romania, August 2012  (2012)

Mean Shift Algorithm for Robust Rigid Registration Between Gaussian Mixtures Models



Article
20th European Signal Processing Conference (Eusipco), Bucharest Romania  (2012)

Shape Model Fitting Algorithm without Point Correspondence



Article
20th European Signal Processing Conference (Eusipco), Bucharest Romania  (2012)

Shape Model Fitting Using non-Isotropic GMM



Article
23nd IET Irish Signals and Systems Conference, Maynooth Ireland  (2012)

Stereo Images for 3D Face Applications=> A Literature Review.



Article
International Machine Vision and Image Processing conference, Limerick, Ireland  (2010)

Lung Perfusion Imaging at 0.5T Using Double Inversion Recovery.

S. Chabert, A. Villanueva

Article
Proceedings of the ISMRM Thirteen Scientific Meeting, USA  (2005)

Multiple Ellipse detection in images using L2 distance

Arellano, Claudia and Dahyot

Article
Pattern Recognition  (0)

ConferencePaper (2)

Extrinsic camera parameters estimation for shape-from-depths

Ruttle, Jonathan; Arellano, Claudia; Dahyot R.

ConferencePaper
 (2012)

Shape model fitting algorithm without point correspondence

Arellano, Claudia; Dahyot R.

ConferencePaper
 (2012)

6
Claudia Arellano

Directora Nacional de I+D Área I&T

Informatica y Telecomunicaciones

universidad Tecnologica de Chile

Santiago, Chile

2
Juan Tapia

Académico

Informática

Universidad de Santiago de Chile

SANTIAGO, Chile

1
Sebastián González

Ingeniero de Investigación y Desarrollo

Investigación y Desarrollo

TOC Biometrics

Santiago, Chile