Man

Juan Antonio Rayas Alvarez

PhD Student

Universidad de Santiago de Chile

Santiago, Chile

Líneas de Investigación


Optical metrology Uncertainty Evaluation Applied Optics Biofilms

Educación

  •  Industrial Engineer, UNIDEG. México, 2001
  •  Técnico Superior Universitario, UTNG. México, 1998

Experiencia Académica

  •   Technician Academic (subject teacher) Other

    Centro de Investigaciones en Óptica

    León, México

    2008 - 2010

Experiencia Profesional

  •   Research technician Full Time

    Centro de Investigaciones en Óptica

    León, México

    1999 - 2012

Formación de Capital Humano


1. Seminar: The optical metrogy, Universidad Tecnológica del Norte de Guanajuato, Industrial engineering, Dolores Hidalgo, Gto., July 2008.
2. Seminar: Optical metrology; applications, Universidad Tecnológica del Norte de Guanajuato, Ingeniería Industrial, Dolores Hidalgo, Gto., August de 2009.
3. Workshop: “Anaglyph”. Centro de Investigaciones en Óptica A.C. (Academy of Children and Youth in Science CONCYTEG). León, Gto. March de 2009.
4. Workshop: Control with LabView, Centro de Investigaciones en Óptica, July – August de 2009.


Premios y Distinciones

  •   Best Paper of the Symposium Award

    The Society for Experimental Mechanics

    Estados Unidos, 2006

    Best Paper of the Symposium Award: “Micrometric topography measurement by imaging a Talbot projected fringe pattern”. R. Rodríguez-Vera, J.A. Rayas, Amalia Martínez and F. Mendoza-Santoyo. Proceedings of the 7th International Symposium on MEMS and Nanotechnology (7th ISMAN). St. Luis, Missouri. USA. pp. 130-139. 2006.

  •   Newport Research Excellence Award. SPIE

    SPIE

    Chile, 2006

    1th place, Newport Research Excellence Award. SPIE: “Development and Application of Talbot Images Technique for Reconstruction of Three Dimensional Objects”, David I. Serrano, Amalia Martínez, Alfonso Serrano-Heredia, J. A. Rayas. Proc. Of Optics and Photonics 2006: Optics, Optomechanics, and Metrology, August 2006, San Diego, USA. Proc. of SPIE Vol. 6292, paper 60.


 

Article (31)

A Panoramic Fringe Projection system
Analysis of the fringes visibility generated by a lateral cyclic shear interferometer in the retrieval of the three-dimensional surface information of an object
The world's highest levels of surface UV
Digital holographic microscopy through a Mirau interferometric objective
Downwelling and upwelling radiance distributions sampled under cloudless conditions in Antarctica
One-shot dual-wavelength in-line digital holographic microscopy
Stereo-Digital Image Correlation (DIC) measurements with a single camera using a biprism
Dynamic phase profile of phase objects based in the use of a quasi-common path interferometer
High topographical accuracy by optical shot noise reduction in digital holographic microscopy
Leaf cuticle topography retrieved by using fringe projection
Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry
Micro- and macro deformation measurement by extension of correlation technique
Iterative estimation of the topography measurement by fringe-projection method with divergent illumination by considering the pitch variation along the x and z directions
Measuring object shape by using in-plane electronic speckle pattern interferometry with divergent illumination
Necking progression in tensile specimens monitored in real-time by using fringe projection
Slope measurement of a phase object using a polarizing phase-shifting high-frequency Ronchi grating interferometer
Uncertainty analysis of whole-field phase-differences retrieved from ESPI fringe patterns by using the Fourier transform method (FTM)
Vibration Analysis at Microscale by Talbot Fringe Projection Method
Analysis of optical configurations for ESPI
Simultaneous measurement with one-capture of the two in-plane components of displacement by electronic speckle pattern interferometry
Evaluation of error in the measurement of displacement vector components by using electronic speckle pattern interferometry
Interferometric measurement of a diffusion coefficient: comparison of two methods and uncertainty analysis
Surface contour from a low-frequency vibrating object using phase differences and the Fourier-transform method
Electronic speckle pattern interferometer design to get maximum sensitivity on the measurement of displacement vector fields
Uncertainty analysis of displacements measured by in-plane electronic speckle-pattern interferometry with spherical wave fronts
Development in situ for Gratings Recorded in Photoresist
Amplitude and phase recovering from a micro-digital hologram using angular spectrum
Computation of crack tip elastic stress intensity factor in mode I by in-plane electronic speckle pattern interferometry
Medición de la evolución temporal de los campos dinámicos de desplazamiento mediante interferometría de moteado para una probeta de latón
Medición del módulo de Young en el hule látex usando ESPI
Topometry and color association by RGB Fringe Projection Technique

ConferencePaper (6)

Monte Carlo method for evaluation of uncertainty in topometry by using in-plane electronic speckle pattern interferometry with divergent illumination
Morphology of leaves cuticle by fringe projection
Dynamic measurement of strain in test specimen by fringe projection
Design and optimization of electronic speckle pattern interferometers to evaluate three dimensional displacements
Systematic error compensation in electronic speckle pattern shearing interferometry
Uncertainty evaluation of displacements measured by ESPI with divergent wavefronts
37
Juan Rayas

PhD Student

Engineering and physics

Universidad de Santiago de Chile

Santiago, Chile

7
Raul R. Cordero

Profesor

FISICA

UNIVERSIDAD DE SANTIAGO

SANTIAGO, Chile

7
Fernando Labbe

Full professor

Department of Mechanical Engineering

Universidad Técnica Federico Santa María

Valparaiso, Chile

4
David Laroze

Full Professor

UNIVERSIDAD DE TARAPACA

Arica, Chile

2
Alessandro Damiani

Associate Researcher

FISICA

UNIVERSIDAD DE SANTIAGO

SANTIAGO, Chile

2
Alessandro Damiani

associate reasercher

USACH

Santiago, Chile