Juan Antonio Rayas Alvarez
PhD Student
Universidad de Santiago de Chile
Santiago, Chile
Optical metrology Uncertainty Evaluation Applied Optics Biofilms
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Industrial Engineer, UNIDEG. México, 2001
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Técnico Superior Universitario, UTNG. México, 1998
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Technician Academic (subject teacher) Other
Centro de Investigaciones en Óptica
León, México
2008 - 2010
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Research technician Full Time
Centro de Investigaciones en Óptica
León, México
1999 - 2012
1. Seminar: The optical metrogy, Universidad Tecnológica del Norte de Guanajuato, Industrial engineering, Dolores Hidalgo, Gto., July 2008.
2. Seminar: Optical metrology; applications, Universidad Tecnológica del Norte de Guanajuato, Ingeniería Industrial, Dolores Hidalgo, Gto., August de 2009.
3. Workshop: “Anaglyph”. Centro de Investigaciones en Óptica A.C. (Academy of Children and Youth in Science CONCYTEG). León, Gto. March de 2009.
4. Workshop: Control with LabView, Centro de Investigaciones en Óptica, July – August de 2009.
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Best Paper of the Symposium Award
The Society for Experimental Mechanics
Estados Unidos, 2006
Best Paper of the Symposium Award: “Micrometric topography measurement by imaging a Talbot projected fringe pattern”. R. Rodríguez-Vera, J.A. Rayas, Amalia Martínez and F. Mendoza-Santoyo. Proceedings of the 7th International Symposium on MEMS and Nanotechnology (7th ISMAN). St. Luis, Missouri. USA. pp. 130-139. 2006.
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Newport Research Excellence Award. SPIE
SPIE
Chile, 2006
1th place, Newport Research Excellence Award. SPIE: “Development and Application of Talbot Images Technique for Reconstruction of Three Dimensional Objects”, David I. Serrano, Amalia Martínez, Alfonso Serrano-Heredia, J. A. Rayas. Proc. Of Optics and Photonics 2006: Optics, Optomechanics, and Metrology, August 2006, San Diego, USA. Proc. of SPIE Vol. 6292, paper 60.